Events

Veeco Demonstration - TUNA AFM module

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Mark your Calendars!

Veeco Demonstration - AFM attachment - TUNA

The week of July 21st, Veeco will bring their TUNA module to LNF for a demonstration. Please mark your calendars and prepare your samples.
TUNA (Tunneling AFM – TUNA) measures a wide range of electrical properties with nanometer-scale resolution on various materials. It is a powerful current sensing technique for the electrical characterization of conductivity variations in highly-to-medium resistive sample. The probe is scanned in contact with the sample (contact mode), topography and electrical data are acquired simultaneously, enabling the direct correlation of a feature location with its electrical properties. Applications include, but are not limited to, failure analysis of semiconductor and data storage devices, two-dimensional carrier profiling of semiconductor devices, and conductivity studies of dielectric, metallic, polymer, organics, and semiconductor films.

For details and time reservation contact Dr Pilar Herrera-Fierro pilarhf@eecs.umich.edu
Exact dates will be given shortly.